High-EF
Structure de mise en forme 2 colonnes
  • Thursday 19 April 2018
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    MFA is devoted to the interdisciplinary study of complex functional materials and nanostructures and the dissemination and application of this knowledge. The main activity of Thin Film Physics Laboratory consists in the theoretical and experimental study of nanostructures and thin layers, including metal, semiconducting, polycrystalline and nanocomposite layers and coatings. The Laboratory is experienced in applying TEM and AEM methods in EU projects and industrial contracts and it is world leader in development of ion-beam preparation equipment used in XTEM sample preparation and in AES depth-profiling (manufactured and sold by a related company). The Lab’s activity is supported by instruments for experimental studies: PVD methods for layer-synthesis, preparation equipment for transmission electron microscopy (mechanical preparation and ion-mills), high resolution and analytical electron microscopes (JEOL 3010 with GIF (EELS), Philips CM-20 with EDS). Experiments are completed
    with a self-developed, unique software method for „imaging-plate-based” quantitative electron diffraction evaluation.

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    Key personal:

    Dr. János L. Lábár, DSc, is the head of Thin Film Physics Laboratory and scientific advisor at MFA, has expertise in preparing (PVD) and characterizing thin films by analytical electron microscopy (AEM) methods (TEM, HRTEM, CBED, EDS, EELS). He is the author of the successful “Process Diffraction” program that was downloaded to more than 5000 laboratories worldwide from its distribution site at the internet. He also has a part-time position of associate professorship at the Eötvös Loránd University (ELTE), Budapest. He obtained his Doctor of Science (DSc) degree from the Hungarian Academy of Sciences in 2005 for developing and applying new methods in the AEM. In 2004 he successfully applied for an investment grant for a GATAN Imaging Filter (GIF), which was installed in the Lab at the end of 2005, providing EELS analysis and related techniques. In 2001 he successfully coordinated the purchase and installation of a 300 keV atomic resolution TEM. In 2004, he was one of the co-directors of a NATO Advances Study Institution on “Electron Crystallography” in Erice, Italy. He spent 2 month as invited professor at the University of Marseille, France in 2004, working on Ni-Ge reactions in thin films. He obtained his habilitation from the University of Debrecen in 2000 after defending his PhD in Budapest in 1991, where he also obtained his MSc diploma (ELTE, 1977). Visits abroad: NIST, Gaithersburg (USA) in 1991 for 2 month and University of Oxford in 1987/88 for 6 month. He is also vice-president of the European Microbeam Analysis Society (EMAS).


    Dr. Árpád Barna, DSc, emeritus scientific advisor at MFA, is a leading expert in developing and applying sample preparation methods. He is the author of 11 patents and more that a hundred scientific papers. His patents serve as the basis of manufacturing ion guns and ion mills, applying these guns.

    Role in the project:

    TEM studies including high resolution, analytics such as EELS and EDX and energyfilter TEM; TEM sample preparation using grinding and ion milling as well as on the spot sample preparation using focused ion beam (FIB).

    Previous European funded projects:

    EURONIM (2001-2004); NANOCOMP (2002-2004); FULLMAT (2002-2006); NAPILIS (2004-2007); INNOVATIAL (2005-2009); FOREMOST (2005-2008); HYPHEN (2005-2008)